Rapid chemical state analysis by a highly sensitive high-resolution PIXE system

We have developed a crystal spectrometer system for rapid chemical state analysis by external beam particle induced X-ray emission. The system consists of a flat single crystal and a five-stacked position-sensitive proportional counter assembly. Chemical state analysis in atmospheric air within several seconds to several minutes is possible. A mechanism for time-resolved measurements is installed in the system. Performance of the system is demonstrated by measuring the time-dependence of chemical shifts of sulfur Kalpha(1.2) line from marine sediment and aerosol samples. (C) 2002 Elsevier Science B.V. All rights reserved.