Journal
SURFACE SCIENCE
Volume 505, Issue 1-3, Pages L215-L221Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0039-6028(02)01380-8
Keywords
surface relaxation and reconstruction; aluminum; aluminum oxide; X-ray scattering, diffraction, and reflection; computer simulations
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Grazing-incidence X-ray diffraction data are combined with energy-minimization calculations to analyse the atomic structure of the Al-rich (3root3 x 3root3)R30degrees reconstructed surface of sapphire alpha-Al2O3 (0001). The experiments on the BM32 beamline of the ESRF provide the non-integer-order diffraction intensities and, after Fourier transform, an incomplete Patterson map. The computer simulations are implemented to obtain structural information from this map, In the simulations, the interactions between the Al overlayer atoms were described with the Sutton-Chen potential and the interactions between the overlayer and the sapphire substrate with a laterally modulated Lennard-Jones potential, We have shown that the hexagonal reconstructed unit cell is composed of triangles where the two layers of Al adatoms are FCC(111) ordered whereas between the triangles the stacking is FCC(001). (C) 2002 Elsevier Science B.V. All rights reserved.
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