4.7 Article Proceedings Paper

Error-related brain activity in obsessive-compulsive undergraduates

Journal

PSYCHIATRY RESEARCH
Volume 110, Issue 1, Pages 63-72

Publisher

ELSEVIER IRELAND LTD
DOI: 10.1016/S0165-1781(02)00034-3

Keywords

obsessive-compulsive inventory; Stroop task; evoked potentials; executive function

Categories

Ask authors/readers for more resources

Error-related negativity (ERN/Ne) is a component of the event-related brain potential (ERP) associated with monitoring action and detecting errors. It is a sharp negative deflection that generally occurs from 50 to 150 ms following response execution and has been associated with activity involving the anterior cingulate cortex (ACC). An enhanced ERN has recently been observed in patients with obsessive-compulsive disorder (OCD). We extended these findings by measuring the ERN in college undergraduates with OC characteristics as measured by the Obsessive-Compulsive Inventory (OCI). Eighteen high-OC Subjects and 17 low-OC subjects performed a modified Stroop task with equal emphasis placed on speed and accuracy. Response-locked ERPs revealed a frontally maximal negativity associated with erroneous responses that was significantly larger in the high-OCI group. There were no performance differences between the two groups. Our results support the view that the characteristics associated with OCD are related to hyper-functioning error and action-monitoring processes. (C) 2002 Elsevier Science Ireland Ltd. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.7
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available