Journal
PHYSICAL REVIEW B
Volume 65, Issue 20, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.65.201401
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Noncontact atomic force microscopy (NC-AFM) has been used to image ultrathin film Al2O3 on NiAl(110). Atomic scale rows were observed with a 9 A periodicity. This provides support for a previous scanning tunneling microscopy study that concluded that the rows arise from the oxide rather than the underlying substrate. NC-AFM data image domain boundaries in the oxide film as either trenches or ridges, depending on the state of the tip. This suggests that NC-AFM does not simply trace the topography of the surface.
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