Characterization of grounds used in canvas and sculpture

Scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FTIR) and X-ray diffraction (XRD) techniques were used to characterise the morphology and analytical composition of available base grounds. The morphology and analytical composition may be related to the method employed in the preparation of the gesso and its provenance (natural or processed gesso). The processes to obtain the gesso described in ancient treatises can be interpreted on the light of studies about its formation and crystalline growth. This work may be of interest in further studies on the grounds used in canvas, sculpture and altarpieces. (C) 2002 Elsevier Science B.V. All rights reserved.