Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 329, Issue -, Pages 649-652Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/S0921-5093(01)01663-X
Keywords
intermetallic compounds; dislocations; TEM; yield strength; fault energy
Ask authors/readers for more resources
The yield strengths of Ti-45Al-xNb and Ti-49Al-xNb (x = 0, 10) with a nearly-equiaxed gamma microstructure were measured at 900 degreesC. Nb addition was found to largely increase the yield strengths but the variation of Al content has little influence on the yield strength of binary TiAl alloys. To understand the strengthening effect of Nb, the stacking fault energies in these alloys were measured using weak-beam transmission electron microscope (TEM) techniques. The SISF energy decreases significantly with the decreasing of Al content of gamma phase in binary alloys but is practically independent of the Al content in ternary alloys. The implications of the dissociation behavior on the mechanical properties of the material will be discussed. (C) 2002 Elsevier Science B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available