4.7 Article

Fabrication and electrical and thermal properties of Ti2InC, Hf2InC and (Ti,Hf)2InC

Journal

JOURNAL OF ALLOYS AND COMPOUNDS
Volume 340, Issue 1-2, Pages 173-179

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/S0925-8388(02)00107-X

Keywords

intermetallics; synthesis; crystal structure; electrical transport; X-ray diffraction

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In this paper we report on the characterization of predominantly single phase, fully dense Ti2InC (Ti1.96InC1.15,), Hf2InC (Hf1.94InC1.26) and (Ti,Hf)(2)InC ((Ti-0.47,Hf-0.56)(2)InC1.26) samples produced by reactive hot isostatic pressing of the elemental powders. The a and c lattice parameters in nm, were, respectively: 0.3134; 1.4077 for Ti2InC; 0.322, 1.443 for (Ti,Hf)(2)InC; and 0.331 and 1.472 for Hf2InC. The heat capacities, thermal expansion coefficients, thermal and electrical conductivities were measured as a function of temperature. These ternaries are good electrical conductors with a resistivity that increases linearly with increasing temperatures. At 0.28 muOmega m, the room temperature resistivity of (Ti,Hf)(2)InC is higher than the end members (similar to0.2 muOmega m), indicating a solid solution scattering effect. In the 300 to 1273 K temperature range the thermal expansion coefficients are: 7.6x10(-6) K-1 for Hf2InC, 9.5x10(-6)K(-1) for Ti2InC, and 8.6x10(-6) K-1 for (Ti,Hf)(2)InC. They are all good conductors of heat (20 to 26 W/m K) with the electronic component of conductivity dominating at all temperatures. Extended exposure of Ti2InC to vacuum (similar to10(-4) atm) at similar to800 degreesC, results in the selective sublimation of In, and the conversion of Ti2InC to TiCx. (C) 2002 Elsevier Science B V All rights reserved.

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