A study on multi-charged Xe ions formed through 3d hole states using a coincidence technique

Multiply charged Xe ions produced through photoionization of a 3d electron have been measured using the coincidence technique. The coincidence measurement between the energy-selected Auger electron and ions specifies the individual Auger decay channels for the various multiply charged ions. It has been found that only quadruply charged ions are formed through the Auger decays of M45N45N45 type. The M45N23N45 Auger decays predominantly yield Xe5+. These findings indicate that most Xe ions produced through the initial M-45 Auger transitions turn into the highest charge state between energetically accessible states through subsequent successive Auger decays. However, in the M45N1N45 and M45N23N23 decays the intensity ratio of Xe5+ with Xe6+ depends on the energy level of the Auger final states. The highly charged ions, Xe7+ and Xe8+, are produced through the initial Auger shake processes from the 3d hole states.