Journal
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
Volume 41, Issue 7B, Pages 4994-4997Publisher
INST PURE APPLIED PHYSICS
DOI: 10.1143/JJAP.41.4994
Keywords
scanning tunneling microscopy; temporal resolution; femtosecond laser
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A promising design for achieving the ultimate spatial and temporal resolution is proposed. With modulation of the time delay between two femtosecond laser pulses repeatedly illuminating a scanning tunneling microscope junction, the induced component of the tunneling current is detected as a function of the delay time. With this method, a high signal-to-noise ratio, stable measurement free from fluctuation of laser intensity, and removal of the thermal expansion effect can be achieved. Using the photovoltage effect of GaAs, the high performance of the newly developed system is demonstrated in the femtosecond range.
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