Development of time-resolved scanning tunneling microscopy in femtosecond range

A promising design for achieving the ultimate spatial and temporal resolution is proposed. With modulation of the time delay between two femtosecond laser pulses repeatedly illuminating a scanning tunneling microscope junction, the induced component of the tunneling current is detected as a function of the delay time. With this method, a high signal-to-noise ratio, stable measurement free from fluctuation of laser intensity, and removal of the thermal expansion effect can be achieved. Using the photovoltage effect of GaAs, the high performance of the newly developed system is demonstrated in the femtosecond range.