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JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
Volume 41, Issue 8, Pages 5034-5037Publisher
INST PURE APPLIED PHYSICS
DOI: 10.1143/JJAP.41.5034
Keywords
GaN; photothermal spectroscopy; thermal conductivity; phonon scattering time; phonon-phonon scattering; phonon-defect scattering
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We have measured photothermal signals of a bulk GaN crystal by the photothermal divergence (PTD) method in the temperature range from 110K to 370K. The thermal conductivity and the scattering time of phonons contributing to the thermal conductivity have been evaluated from the, photothermal signals. A phonon-defect interaction has been expected to play a crucial role in determining the thermal properties of the sample employed here in the above temperature range.
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