Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 49, Issue 4, Pages 1999-2004Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2002.801697
Keywords
neutron detector; semiconductor detector
Ask authors/readers for more resources
Experimental devices using patterns of holes etched into semiconductor surfaces are under evaluation for use as neutron detectors. The devices have miniature holes equidistantly spaced so as to completely cover the front surface of a planar semiconductor device. The devices have both electrical contacts and neutron-reactive coatings applied over the surface and within the holes. The tiny via holes assist in thin-film adhesion while offering a method to increase the thermal-neutron detection efficiency.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available