4.6 Article

Atomic scale memory at a silicon surface

Journal

NANOTECHNOLOGY
Volume 13, Issue 4, Pages 499-502

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/13/4/312

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The limits of pushing storage density to the atomic scale are explored with a memory that stores a bit by the presence or absence of one silicon atom. These atoms are positioned at lattice sites along self-assembled tracks with a pitch of five atom rows. The memory can be initialized and reformatted by controlled deposition of silicon. The writing process involves the transfer of Si atoms to the tip of a scanning tunnelling microscope. The constraints on speed and reliability are compared with data storage in magnetic hard disks and DNA.

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