Journal
MEASUREMENT SCIENCE AND TECHNOLOGY
Volume 13, Issue 8, Pages 1217-1222Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0957-0233/13/8/308
Keywords
photothermal; FT-IR; synchrotron; near field; localized spectroscopy
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Synchrotron radiation has been used to perform near-field photothermal Fourier transform infrared (IR) spectroscopy, in a brief exploratory investigation. An optical microscope is used to focus the IR beam onto a thermal probe, in contact with the surface of a sample, mounted in a specially designed atomic force microscope head. The stable and highly collimated synchrotron radiation beam gives a very small effective source size with low thermal noise. We used a miniature batch-manufactured micromachined type of thermal probe as the temperature sensor. The results of a three-day trial showed that the spectral contrast observed is much improved in comparison with that seen in spectra obtained using a thermal source. Measurements on a polypropylene/polycaprolactone interface confirmed that line-map measurements should be practicable. One potential advantage of the technique is that it uses the same sensor, the thermal probe, as a number of complementary analytical methods.
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