Journal
OPTICS LETTERS
Volume 27, Issue 16, Pages 1421-1423Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.27.001421
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An original approach to directly measuring the Goos-Hanchen longitudinal shift between TE and TM polarization states during a total internal reflection is introduced. The technique is based on the modulation of the polarization state of a laser by an electro-optic modulator combined with a precise measurement of the resulting spatial displacement with a position-sensitive detector. This method presents many advantages over other techniques and allows measurements at different wavelengths over a broad range for the incident angle. (C) 2002 Optical Society of America.
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