Journal
OPTICS COMMUNICATIONS
Volume 209, Issue 4-6, Pages 369-375Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0030-4018(02)01672-3
Keywords
Bruggeman formalism; chiral sculptured thin film; circular Bragg phenomenon; model calibration; structure-properties relationship model; transmittance measurements
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A chiral sculptured thin film is fabricated from patinal titanium oxide using the serial bideposition technique. Axial transmittance spectrums are measured over a spectral region encompassing the Bragg regime for axial excitation. The same spectrums are calculated using a nominal structure-property relationship model and the parameter space of the model is explored for best fits of the calculated and measured transmittances. Ambiguity arising on calibrating the model against axial transmittance measurements is shown to be resolvable using non-axial transmittance measurements. (C) 2002 Elsevier Science B.V. All rights reserved.
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