Journal
JOURNAL OF APPLIED PHYSICS
Volume 117, Issue 11, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4913827
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Funding
- Department of Energy (DOE) [DE-FG02-07ER46386]
- National Science Foundation (NSF) [DMR-1202532, CBET-1034308]
- DOE's Office of Biological and Environmental Research
- Office of Naval Research [N00014-12-1-0830]
- U.S. Department of Energy (DOE) [DE-FG02-07ER46386] Funding Source: U.S. Department of Energy (DOE)
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [1202532] Funding Source: National Science Foundation
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Zinc oxide (ZnO) has potential for a range of applications in the area of optoelectronics. The quest for p-type ZnO has focused much attention on acceptors. In this paper, Cu, N, and Li acceptor impurities are discussed. Experimental evidence indicates these point defects have acceptor levels 3.2, 1.4, and 0.8 eV above the valence-band maximum, respectively. The levels are deep because the ZnO valence band is quite low compared to conventional, non-oxide semiconductors. Using MoO2 contacts, the electrical resistivity of ZnO:Li was measured and showed behavior consistent with bulk hole conduction for temperatures above 400 K. A photoluminescence peak in ZnO nanocrystals is attributed to an acceptor, which may involve a Zn vacancy. High field (W-band) electron paramagnetic resonance measurements on the nanocrystals revealed an axial center with g(perpendicular to) = 2.0015 and g(//) = 2.0056, along with an isotropic center at g = 2.0035. (C) 2015 AIP Publishing LLC.
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