Selection of the shaping circuits of a multilayer semiconductor spectrometer of charged particles

The influence of the charge collection time in silicon detectors on the accuracy of charged particle energy measurements is considered. Calculation and experimental data show that this parameter exerts a significant effect on the selection of the shaping time constants tau of multilayer silicon spectrometers. This is especially important for systems based on Si(Li) detectors, which are designed for detecting long-range charged particles (p, d, t) with energies E similar to 100 MeV. It is shown that the time constant tau = 1.5 mus ensures a high accuracy in the absolute energy calibration.