4.5 Review

The microscopic origin of the doping limits in semiconductors and wide-gap materials and recent developments in overcoming these limits: a review

Journal

JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 14, Issue 34, Pages R881-R903

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/14/34/201

Keywords

-

Ask authors/readers for more resources

This paper reviews the recent developments in first-principles total energy studies of the phenomenological equilibrium 'doping limit ruled that governs the maximum electrical conductivity of semiconductors via extrinsic or intrinsic doping. The rule relates the maximum equilibrium carrier concentrations (electrons or holes) of a wide range of materials to their respective band alignments. The microscopic origin of the mysterious 'doping limit rule' is the spontaneous formation of intrinsic defects: e.g., in n-type semiconductors, the formation of cation vacancies. Recent development-, in overcoming the equilibrium doping limits are also discussed: it appears that a common route to significantly increase carrier concentrations is to expand the physically accessible range of the dopant atomic chemical potential by non-equilibrium doping processes. which not only suppresses the formation of the intrinsic defects but also lowers the formation energy of the impurities, thereby significantly increasing their solubility.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available