4.4 Article

The suppression of NiO reduction in Fe/NiO systems by use of an ultrathin MgO buffer layer, investigated by photoemission and low energy electron diffraction

Journal

SURFACE SCIENCE
Volume 516, Issue 1-2, Pages L515-L521

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/S0039-6028(02)01906-4

Keywords

iron; magnesium oxides; nickel oxides; epitaxy; growth; magnetic interfaces; X-ray photoelectron spectroscopy; low energy electron diffraction (LEED)

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Ferromagnetic and antiferromagnetic multilayers are promising candidates for new magnetic sensors with spin-valve properties. At room temperature, thin Fe films with a thickness of about 5 monolayers (ML) were deposited on single crystalline NiO(0 0 1), grown epitaxially on bulk Ag(0 0 1). In order to suppress the occurrence of a distinct NiO reduction, a MgO film of different thicknesses (x = 2.5; 5.0 ML) was additionally deposited as a buffer layer. The different Fe/MgO/NiO/Ag(0 0 1) systems were investigated by means of photoemission and low energy electron diffraction. The main finding is, that the reduction of nickel oxide to nickel metal at the Fe/NiO interface can be nearly suppressed by the presence of few ML MgO between the Fe film and the NiO substrate. (C) 2002 Elsevier Science B.V. All rights reserved.

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