Direct observation of magnetization switching in focused-ion-beam-fabricated magnetic nanotubes

In this letter, a direct measurement of easy magnetization switching indicating zero-magnetization remanence in a magnetic probe with a cross section as narrow as 60x60 nm(2), and as tall as 750 nm, is presented. Magnetic force microscopy was utilized to test focused-ion-beam-fabricated nanomagnetic probes. The data directly indicate that unlike a regular solid probe, a probe with a tubelike ending (nanotube) provides substantially easier switching. (C) 2002 American Institute of Physics.