Journal
APPLIED PHYSICS LETTERS
Volume 81, Issue 12, Pages 2297-2299Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1507830
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The band alignment at polycrystalline CdS/CdTe heterointerfaces for thin-film solar cells is determined by photoelectron spectroscopy from stepwise CdTe deposition on polycrystalline CdS substrates and from subsequent sputter depth profiling. Identical values of 0.94+/-0.05 eV for the valence band offset are obtained. (C) 2002 American Institute of Physics.
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