Journal
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE
Volume 6, Issue 5, Pages 479-485Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S1359-0286(02)00078-5
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Gas-phase reactions of simple silicon hydride species underlying many types of chemical vapor deposition processes for silicon-based thin-film growth are reviewed in this paper. Mass spectrometry and laser-based spectroscopy are applied to identify gas-phase intermediates in thermal and hot-wire chemical vapor deposition processes. The mechanism of the thermal decomposition of silanes, including reactions that lead to the formation of hydrogenated silicon clusters, is examined. The gas-phase chemical kinetic mechanism in hot-wire chemical vapor deposition is proposed to explain precursor molecules for the film growth. (C) 2002 Elsevier Science Ltd. All rights reserved.
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