Journal
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME
Volume 82, Issue 9, Pages -Publisher
ASME
DOI: 10.1115/1.4030739
Keywords
blister test; thin film; constitutive relation; deformed substrate; deflection
Categories
Funding
- National Program on the Development of Scientific Instrument and Equipment [2011YQ160002]
- Fundamental Research Fund for Central Universities [HUST2010MS090]
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This paper presents the nonlinear large deflection of the thin film and the effect of substrate deformation on the thin film deflection through the shaft-loaded blister test. The blister of thin film can be divided into two parts, namely, the annular contact brim and the central noncontact bulge. A two-coupled line spring model is developed to describe the deformation of the contact part, and Foppl-Hencky equations are employed to study the constitutive relation between the applied load and the central deflection. The analytical and numerical solutions for the constitutive relation between the applied load and the deflection of thin film with considering the deformation of substrate are derived.
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