Journal
APPLIED PHYSICS LETTERS
Volume 81, Issue 18, Pages 3389-3391Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1518776
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As-grown and Zn-implanted wurtzite GaN samples have been studied by angle-dependent x-ray absorption near edge structure (XANES) measurements at the N and Ga K-edges and the Ga L-3-edge. The angle dependence of the XANES spectra shows that the Ga-N bonds lying in the bilayer have lower energies than bonds along the c-axis, which can be attributed to the polar nature of the GaN film. The comparison of the Ga L3-edge XANES spectra of as-grown and Zn-doped GaN reveals significant dopant induced enhancement of near-edge Ga d-derived states. (C) 2002 American Institute of Physics.
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