Journal
IEE PROCEEDINGS-SCIENCE MEASUREMENT AND TECHNOLOGY
Volume 149, Issue 6, Pages 345-350Publisher
INST ENGINEERING TECHNOLOGY-IET
DOI: 10.1049/ip-smt:20020763
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The state-of-the-art in lightwave network analysis is reviewed. Existing commercial instruments use simple architectures which limit the type of calibrations that are available for lightwave S-parameter measurements. However, recent research at The University of Leeds has demonstrated the feasibility of using reversible test sets and modular approaches, which offer the option of full two-post self-calibration routines for the first time. Experimental results for the error-corrected S-parameter measurement of optical, optoelectronic and electro-optic two-ports are presented.
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