Journal
VACUUM
Volume 69, Issue 1-3, Pages 327-331Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0042-207X(02)00353-6
Keywords
PVD; thin films; AgBr; microstructure; electrical and mechanical properties
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It is demonstrated that porous silver bromide films could be obtained via variation of one basic parameter of the PVD technique: the vapour incidence angle. This leads to the preparation of thin AgBr films with different surface-to-volume ratio. Relationship between the film microstructure and microhardness as well as dark ionic conductivity is found, thus revealing an opportunity for designing of novel AgBr thin film materials. (C) 2002 Elsevier Science Ltd. All rights reserved.
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