Journal
APPLIED PHYSICS LETTERS
Volume 81, Issue 27, Pages 5135-5137Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1532551
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Morphology evolution of thin film growth can be quantitatively modeled by employing rate equations for two-dimensional, single-valued functions within a treatment of small perturbations. This description can be expected to be valid in an intermediate film thickness regime, where substrate influences and three-dimensional effects are minor. The breakdown of. the mathematical description in its upper film thickness limit is systematically investigated by a detailed comparison of experiments and simulation. Possible reasons for the failure are discussed and improvements are suggested. (C) 2002 American Institute of Physics. [DOI: 10.1063/1.153551].
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