Journal
SYNTHETIC METALS
Volume 132, Issue 2, Pages 125-132Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/S0379-6779(02)00197-2
Keywords
polypyrrole Raman spectroscopy; doping level; film thickness
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In this paper, we present resonance Raman spectroscopic studies on as-grown thin polypyrrole (PPy) films electrochemically deposited on flat platinum electrode surfaces by direct oxidation of pyrrole in acetonitrile. It was found that the overall features of the Raman spectra depend strongly on film thickness, mainly due to that the doping level of PPy increases during film growth process. Electrochemical and X-ray photoelectron spectroscopic (XPS) examinations have confirmed this discovery. The doping level of PPy film with a given thickness also depends on the property of supporting electrolyte. (C) 2002 Elsevier Science B.V. All rights reserved.
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