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JOURNAL OF APPLIED PHYSICS
Volume 93, Issue 3, Pages 1515-1519Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1534625
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The elastic and mechanical properties of high-quality cubic boron nitride (cBN) films with a few, microns thickness and submicron grain size grown on silicon substrates by chemical vapor deposition were determined by measuring the dispersion of surface acoustic waves propagating along the surface of the layered system. The values are compared with those obtained with an ultralow load indenter (Triboscope). Specifically, the hardness, Young's modulus and density of the film were measured. (C) 2003 American Institute of Physics. [DOI: 10.1063/1.1534625].
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