Journal
APPLIED PHYSICS LETTERS
Volume 82, Issue 5, Pages 727-729Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1541116
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Thin-film solid solutions of SmxNd1-xNiO3 were synthesized on NdGaO3 substrates by pulsed-laser deposition using alternating NdNiO3 and SmNiO3 targets. The films were characterized by x-ray diffraction and variable-temperature four-probe conductivity measurements. The films grow in the {100}(pseudocubic) direction. There is a nearly linear increase of the metal-insulator transition from 199 K for x=0 to 378 K for x=1, with the composition corresponding to x=0.6 displaying a transition near room temperature. (C) 2003 American Institute of Physics.
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