Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy -: art. no. 085402

Atomically resolved scanning force microscopy images and force versus distance measurements at low temperatures on a cleaved NiO (001) single crystal are reported. The force-distance data are well modeled with a capacitive force in the distance range of 0.5 to 20 nm. The residual forces at smaller tip-sample distances show a maximum attraction of 2.3 nN and decay within 0.2 nm. They show a steplike behavior associated with an increase in dissipation signal. This steplike behavior can be explained by interaction of more than one atom of the tip or of the surface.