Journal
APPLIED SURFACE SCIENCE
Volume 210, Issue 1-2, Pages 12-17Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0169-4332(02)01472-1
Keywords
non-contact atomic force microscopy; small oscillation amplitudes; Si(100)-(2 x 1); force-distance spectroscopy; dissipation-distance spectroscopy; short-range forces; atomic scale dissipation
Ask authors/readers for more resources
Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 x 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Angstrom oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat. (C) 2003 Elsevier Science B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available