Journal
SURFACE AND INTERFACE ANALYSIS
Volume 35, Issue 4, Pages 410-412Publisher
WILEY-BLACKWELL
DOI: 10.1002/sia.1543
Keywords
atomic force microscopy (AFM); poly(ethyleneterephthalate) (PET); topographical surface modifications
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Atomic force microscopy (AFM) has been applied to investigate the morphological and topographical surface modifications induced by radiofrequency cold plasma processing of poly (ethyleneterephthalate) textiles. Surface effects are analysed in low-pressure air plasma for different plasma exposure times. The results show a progressive degradation of the surface with increasing roughness. The analysis suggests that modification of the surface during textile treatment may be ascribed to a plasma-induced physical process. Copyright (C) 2003 John Wiley Sons, Ltd.
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