Journal
SMART MATERIALS & STRUCTURES
Volume 12, Issue 2, Pages 217-222Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0964-1726/12/2/309
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This study describes sample preparation techniques that allow atomic force microscope observation of domains on the scale of tens of nanometers in tine-grained bulk lead zirconate titanate (PZT) ceramics. It is shown that carefully conducted light polishing and etching results in no signiticant disturbance to domain morphologies in hard PZT ceramics.
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