Journal
METALS AND MATERIALS INTERNATIONAL
Volume 9, Issue 2, Pages 193-199Publisher
KOREAN INST METALS MATERIALS
DOI: 10.1007/BF03027277
Keywords
Sn-3.5Ag solder; intermetallic compound; growth kinetics; activation energy; isothermal aging
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The growth kinetics of intermetallic compound layers formed between Sn-3.5Ag solder and Cu substrate were investigated as a consequence of solid-state isothermal aging. Isothermal aging was carried out in a temperature range between 70degreesC and 200degreesC for 0 to 60 days. A quantitative analysis of the intermetallic compound layer thickness as a function of time and temperature was performed. The diffusion couples showed a composite intermetallic layer comprised Of Cu6Sn5 and Cu3Sn. The growth of intermetallic compounds followed diffusion-controlled kinetics and the layer thickness reached only 9 mum after 60 day of aging at 150degreesC. The apparent activation energies were calculated for the growth of the total intermetallic compound (Cu6Sn5 + Cu3Sn); Cu6Sn5 and Cu3Sn intermetallic are 65.4, 55.4 and 75.7 kJ/mol, respectively.
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