Journal
SYNTHETIC METALS
Volume 137, Issue 1-3, Pages 991-992Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/S0379-6779(02)01067-6
Keywords
CuPc; organic semiconductor; field-effect transistor
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We have fabricated thin film field effect transistors using CuPc as a semiconductive layer and estimated electrical parameters such as carrier mobility and on/off ratio by field effect measurement. It is found that FET characteristics are strongly dependent on the ordered film morphology.
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