4.6 Article

Experimental and full multiple scattering approaches to energy-loss near-edge structures (ELNES) for c-Si, a-Si and a-Si:H

Journal

CHEMICAL PHYSICS LETTERS
Volume 371, Issue 3-4, Pages 498-503

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/S0009-2614(03)00308-7

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To study the structures of amorphous Si (a-Si) and amorphous hydrogenated Si (a-Si:H), we have measured Si L-2,L-3-edge ELNES spectra of these systems and crystalline silicon (c-Si) for the reference by use of the transmission mode. The observed spectra are carefully studied by use of the full multiple scattering calculations. The observed differences of the spectra for a-Si and a-Si:H from that for c-Si are well explained by some plausible models. The analyses of the ELNES for a-Si support the defect model where some Si atoms are removed away, and those for a-Si:H support a hydrogen substitution model where some Si atoms are randomly substituted by H atoms keeping the diamond structure (C) 2003 Elsevier Science B.V. All rights reserved.

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