Journal
APPLIED PHYSICS LETTERS
Volume 82, Issue 15, Pages 2497-2499Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1566798
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The stress-induced self-assembled growth of SrRuO3 on LaAlO3 was studied by atomic force microscopy and x-ray diffraction. SrRuO3 epitaxially grown on LaAlO3 by pulsed laser deposition shows two types of out-of-plane arrangements and four in-plane matches. The lattice mismatch (stress) produced by these arrangements was estimated and correlated with the SrRuO3 growth dynamics. After 1 nm, the SrRuO3 film surface exhibits a ripple structure, which serves as a template for the development of a nanopattern of flat islands. These islands coalesce anisotropically resulting in a regular array of infinite wires. The wire coalescence for the 12-20 nm thick film nullifies the surface symmetry, while SrRuO3 keeps growing in three dimensions. (C) 2003 American Institute of Physics.
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