Journal
JOURNAL OF APPLIED PHYSICS
Volume 93, Issue 8, Pages 4442-4446Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1559423
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The prospect of using reflectance anisotropy spectroscopy (RAS) for process control in the fabrication of liquid crystal devices is investigated. Measurements of the optical anisotropy induced by mechanically rubbing polymer thin films are presented and interpreted in terms of molecular alignment and form birefringence models. Optical characterization of completed liquid crystal cells enables RAS measurements to be correlated with device characteristics. (C) 2003 American Institute of Physics.
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