Journal
APPLIED PHYSICS LETTERS
Volume 82, Issue 17, Pages 2886-2888Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1570497
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Semiconducting oxide nanobelts of ZnO have been sectioned and manipulated, for microelectromechanical systems, using an atomic force microscopy probe. Structurally modified nanobelts demonstrate potential for nanocantilever based technologies. With dimensions similar to35-1800 times smaller than conventional cantilevers, the nanocantilevers are expected to have improved physical, chemical, and biological sensitivity for scanning probe microscopy and sensor applications. (C) 2003 American Institute of Physics.
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