Journal
JOURNAL OF CRYSTAL GROWTH
Volume 252, Issue 1-3, Pages 180-183Publisher
ELSEVIER
DOI: 10.1016/S0022-0248(02)02481-8
Keywords
metalorganic molecular beam epitaxy; oxides; semiconducting II-VI materials
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The ZnO films were deposited on (0 0 I)Si substrate by metal-organic chemical vapor deposition (MOCVD). Annealing was performed in air for 60 min at 800degreesC. The X-ray diffraction patterns of the samples showed sharp diffraction peaks for ZnO(0 0 2), which indicated that the films were highly c-axis oriented. Zn and O elements in the as-deposited ZnO film were investigated and compared with those in the annealed ZnO film by using X-ray Photoelectron Spectroscopy (XPS). XPS spectra showed that ZnO films changed from Zn-rich to O-rich after being annealed. (C) 2003 Elsevier Science B.V. All rights reserved.
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