Journal
WEAR
Volume 254, Issue 9, Pages 917-923Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/S0043-1648(03)00247-3
Keywords
fractals; contact mechanism; friction; atomic force microscope; carbon
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We investigated the contact mechanics and friction forces between atomic force microscope (AFM) probes and self-affine fractal carbon films. We studied single-asperity contacts by means of conventional nanometric conical tips whilst custom-designed micrometric flat tips were adopted to form multiple junctions between the probe and the sample. By varying the externally applied load we found that the average frictional force follows a power-law behavior in the single-asperity regime and a linear behavior in the multi-asperity regime. The friction coefficient was the same for carbon specimens having different fractality. We also acquired quasi-static load-displacement curves on micrometric scale, revealing a strong dependence of the average indentation depth on the values of fractal parameters. A comparison of experimental data with contact theories for randomly rough surfaces is provided. (C) 2003 Elsevier Science B.V. All rights reserved.
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