Journal
APPLIED OPTICS
Volume 42, Issue 14, Pages 2506-2512Publisher
OPTICAL SOC AMER
DOI: 10.1364/AO.42.002506
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Modern synchrotron beamlines often take the form of critical illumination systems, where an incoherent source of limited spatial extent is re-imaged to an experimental plane of interest. Unique constraints of synchrotron sources and beamlines, however, may preclude the use of the simple Zernike approximation for calculating the object-image coherence relationship. Here, we perform a rigorous analysis of the object-image coherence relationship valid for synchrotron beamlines. The analysis shows that beamline aberrations have an effect on the coherence properties. Effects of various low-order aberrations on the coherence properties are explicitly studied. (C) 2003 Optical Society of America.
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