Journal
PHYSICAL REVIEW B
Volume 67, Issue 20, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.67.201306
Keywords
-
Ask authors/readers for more resources
Using scanning tunneling microscopy (STM), we studied the dimer structure of the Si(001)2x1 surface at low temperature (<10 K). Asymmetric (buckled) dimer structure, locally forming c(4x2) or p(2x2) periodicity, was observed with positive sample bias voltages, while most of the dimers appear symmetric with negative bias voltages. Our observation indicates that actual dimer structure is asymmetric and that the apparent symmetric dimer observation is due to an artifact induced by STM imaging. Since a transition temperature between the buckled- and symmetric-dimer imaging, which is found to be similar to 40 K, corresponds to the temperature where the carrier density changes dramatically from intrinsic to saturation range, the apparent symmetric-dimer imaging should be related with the reduced carrier density and ensuing charging effect.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available