4.8 Article Proceedings Paper

XAFS and TOF-SIMS analysis of SEI layers on electrodes

Journal

JOURNAL OF POWER SOURCES
Volume 119, Issue -, Pages 567-571

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/S0378-7753(03)00291-X

Keywords

lithium-ion battery; XAFS; SK-edge XANES; TOF-SIMS; SEI

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We have used X-ray absorption fine structure (XAFS) in order to analyze the solid electrolyte interface (SEI) layer on the graphite anode and the LiCoO2 cathode in a lithium-ion battery. The SEI layers on the electrodes in the propylene carbonate (PC)-based electrolyte containing an ethylene sulfite (ES) additive were analyzed based on the different sulfur oxidation states with sulfur K-edge X-ray absorption near-edge structure spectroscopy (S K-edge XANES), X-ray photoelectron spectroscopy (XPS) and time-of-flight-secondary ion mass spectrometry (TOF-SIMS). The SEI layer on the graphite anode was mainly consisted of a sultite-type compound with an inorganic film like Li2SO3 and an organic films like ROSO2Li. Furthermore, it was proven that the SEI layer on the graphite anode contained alkyl sulfide species. We also found that the SEI layer on the LiCoO2 cathode also contained alkyl sulfide species. (C) 2003 Published by Elsevier Science B.V.

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