Journal
IEEE TRANSACTIONS ON NEURAL SYSTEMS AND REHABILITATION ENGINEERING
Volume 11, Issue 2, Pages 173-177Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNSRE.2003.814446
Keywords
grain-computer interface (BCI); electroencephalography (EEG); error related negativity (ERN); eye blink removal; single-trial detection
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We describe a brain-computer interface (BCI) system, which uses a set of adaptive linear. preprocessing and classification algorithms for single-trial detection of error related negativity (ERN). We use the detected ERN as an estimate of a subject's perceived error during an alternative forced choice visual discrimination task. The detected ERN is used to correct subject errors. Our initial results show average improvement in subject performance of 21% when errors are automatically corrected via the BCI. We are currently investigating the generalization of the overall approach to other tasks and stimulus paradigms.
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