Journal
JOURNAL OF MICROSCOPY-OXFORD
Volume 210, Issue -, Pages 274-278Publisher
BLACKWELL PUBLISHING LTD
DOI: 10.1046/j.1365-2818.2003.01143.x
Keywords
fluorescence resonance energy transfer; near-field optics; semiconductor nanocrystals
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Local fluorescence probes based on CdSe semiconductor nanocrystals were prepared and tested by recording scanning near-field optical microscopy (SNOM) images of calibration samples and fluorescence resonance energy transfer SNOM (FRET SNOM) images of acceptor dye molecules inhomogeneously deposited onto a glass substrate. Thousands of nanocrystals contribute to the signal when this probe is used as a local fluorescence source while only tens of those (the most apical) are involved in imaging for the FRET SNOM operation mode. The dip-coating method used to make the probe enables diminishing the number of active fluorescent nanocrystals easily. Prospects to realize FRET SNOM based on a single fluorescence centre using such an approach are briefly described.
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