4.4 Article Proceedings Paper

Sub-50 nm period patterns with EUV interference lithography

Journal

MICROELECTRONIC ENGINEERING
Volume 67-8, Issue -, Pages 56-62

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/S0167-9317(03)00059-5

Keywords

interference lithography; multiple beam; extreme ultraviolet; diffraction grating; undulator

Ask authors/readers for more resources

We have used transmission diffraction gratings in an interferometric setup to pattern one- and two dimensional periodic patterns with periods near 50 nm. The diffraction gratings were written with e-beam lithography. The exposures were made at 13.4 nm wavelength with undulator radiation, which provides spatially coherent radiation. This technique offered a multiplication of pattern frequency by a factor of 2 and root2 in the one- and two-dimensional cases, respectively. Interference lithography with gratings offers a number of advantages, including achromaticity and insensitivity to misalignment. The demonstrated structures include line/space patterns with 45 nm period and a square array of holes with 56 nm period. (C) 2003 Elsevier Science B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.4
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available