Journal
SURFACE & COATINGS TECHNOLOGY
Volume 169, Issue -, Pages 525-527Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/S0257-8972(03)00170-1
Keywords
indium oxide; tin; sol-gel; X-ray fluorescence; profilometry
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Tin-doped In2O3 (ITO) transparent conducting films were prepared by the dip-coating process using a novel solution, indium triformate. In(OCHO)(3), and tin dichloride, SnCl2.2H(2)O, dissolved in the ethanol containing 2-aminoethanol, H2NC2H4OH. The composition of the films (thickness, similar to295 nm) agreed approximately with that of the solution when the dipping and the heating in air at 600 degreesC for 30 min were repeated 30 times. The ITO films were highly transparent in the visible range. The influence of the film composition [Sn/(In+Sn)) on the electrical properties of the as-deposited films was investigated between 0 and 20 at.%Sn. The maximum carrier concentration (1.0 x 10(21) cm(-3)) and minimum resistivity (2.1 x 10(-4) ohm cm) were obtained at 6.1 at.%Sn with relatively high mobility (28 cm(2)V(-1) s(-1)) after annealing in N-2-0.1%H-2 flow at 600 degreesC for 1 h. 4) 2003 Elsevier Science B.V. All rights reserved.
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