Journal
APPLIED PHYSICS LETTERS
Volume 83, Issue 1, Pages 123-125Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1589186
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We have studied the cubic-to-tetragonal phase transition in epitaxial SrTiO3 films under various biaxial strain conditions using synchrotron x-ray diffraction. Measuring the superlattice peak associated with TiO6 octahedra rotation in the low-temperature tetragonal phase indicates the presence of a phase transition whose critical temperature is a strong function of strain, with T-C as much as 50 K above the corresponding bulk temperature. Surprisingly, the lattice constants evolve smoothly through the transition, with no indication of a phase change. This signals an important change in the nature of the phase transition due to the epitaxial strain and substrate clamping effect. The internal degrees of freedom (TiO6 rotations) evolve independently from the overall lattice shape. (C) 2003 American Institute of Physics.
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